Nobuyoshi Kogawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle measuring device and measuring method thereof
- Patent number 6,774,638
- Issue date Aug 10, 2004
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle measuring device and measuring method thereof
- Patent number 6,639,392
- Issue date Oct 28, 2003
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged particle measuring device and measuring method thereof
- Publication number 20030146760
- Publication date Aug 7, 2003
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Application
Charged particle measuring device and measuring method thereof
- Publication number 20030030444
- Publication date Feb 13, 2003
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING