Nobuyuki Harabe

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Ultrafine pattern discrimination using transmitted/reflected workpi...
- Patent number 8,094,926
- Issue date Jan 10, 2012
- Kabushiki Kaisha Toshiba
- Nobuyuki Harabe
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and apparatus with high-accuracy pattern...
- Patent number 7,627,164
- Issue date Dec 1, 2009
- Advanced Mask Inspection Technology Inc.
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ULTRAFINE PATTERN DISCRIMINATION USING TRANSMITTED/REFLECTED WORKPI...
- Publication number 20090304262
- Publication date Dec 10, 2009
- Advanced Mask Inspection Technology, Inc.
- Nobuyuki HARABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection method and apparatus with high-accuracy pattern...
- Publication number 20070064994
- Publication date Mar 22, 2007
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image correcting apparatus, pattern inspection apparatus, and image...
- Publication number 20070053583
- Publication date Mar 8, 2007
- Advanced Mask Inspection Technology Inc.
- Nobuyuki Harabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Reference image forming apparatus, pattern inspection apparatus, an...
- Publication number 20070052960
- Publication date Mar 8, 2007
- Advanced Mask Inspection Technology Inc.
- Nobuyuki Harabe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Pattern inspection apparatus and method and reticle for use therein
- Publication number 20070053578
- Publication date Mar 8, 2007
- Advanced Mask Inspection Technology Inc.
- Nobuyuki Harabe
- G06 - COMPUTING CALCULATING COUNTING