Nobuyuki Hayashi

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Patents Grantslast 30 patents

Information Patent Grant
Generation of product mesh and product dimensions from user image d...
- Patent number 11,869,152
- Issue date Jan 9, 2024
- Bodygram, Inc.
- Chong Jin Koh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of preparing yeast for fermentation test
- Patent number 7,713,717
- Issue date May 11, 2010
- Kirin Beer Kabushiki Kaisha
- Nobuyuki Hayashi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Gene conferring flocculating property on yeast and gene product the...
- Patent number 5,866,374
- Issue date Feb 2, 1999
- Kirin Beer Kabushiki Kaisha
- Osamu Kobayashi
- C07 - ORGANIC CHEMISTRY

Patents Applicationslast 30 patents

Information Patent Application
Generation of Product Mesh and Product Dimensions from User Image D...
- Publication number 20230186567
- Publication date Jun 15, 2023
- Bodygram, Inc.
- Chong Jin Koh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POLYIMIDE PRECURSOR, POLYIMIDE PRODUCED FROM SAME, AND FLEXIBLE DEVICE
- Publication number 20210340325
- Publication date Nov 4, 2021
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Hongyuan WANG
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
PRIMER SET FOR USE IN DETECTION OF YEAST OF GENUS SACCHAROMYCES
- Publication number 20100216127
- Publication date Aug 26, 2010
- KIRIN BEER KABUSHIKI KAISHA
- Nobuyuki Hayashi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
PRIMER SET FOR DETECTION OF DEKKERA YEAST OR BRETTANOMYCES YEAST
- Publication number 20100047781
- Publication date Feb 25, 2010
- Kirin Beer Kabushiki Kaisha
- Nobuyuki Hayashi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Method of preparing yeast for fermentation test
- Publication number 20040072329
- Publication date Apr 15, 2004
- Nobuyuki Hayashi
- G01 - MEASURING TESTING