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Nobuyuki Hirai
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Shizuoka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Analysis system and analysis method
Patent number
10,591,427
Issue date
Mar 17, 2020
Hamamatsu Photonics K.K.
Tomonori Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
System for testing integrated circuit and method for testing integr...
Patent number
10,508,996
Issue date
Dec 17, 2019
Hamamatsu Photonics K.K.
Tomonori Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analysis system and analysis method
Patent number
10,330,615
Issue date
Jun 25, 2019
Hamamatsu Photonics K.K.
Tomonori Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing a semiconductor device and method of testing...
Patent number
9,618,576
Issue date
Apr 11, 2017
Hamamatsu Photonics K.K.
Akihiro Otaka
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for inspecting integrated circuit
Patent number
9,099,350
Issue date
Aug 4, 2015
Hamamatsu Photonics K.K.
Tomonori Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Time-resolved measurement apparatus and position-sensitive election...
Patent number
7,619,199
Issue date
Nov 17, 2009
Hamamatsu Photonics K.K.
Nobuyuki Hirai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-resolved measurement apparatus
Patent number
7,425,694
Issue date
Sep 16, 2008
Hamamatsu Photonics K.K.
Mitsunori Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Two dimensional weak emitted light measuring device
Patent number
4,704,522
Issue date
Nov 3, 1987
Hamamatsu Photonics Kabushiki Kaisha
Nobuyuki Hirai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ANALYSIS SYSTEM AND ANALYSIS METHOD
Publication number
20190265179
Publication date
Aug 29, 2019
HAMAMATSU PHOTONICS K. K.
Tomonori NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS SYSTEM AND ANALYSIS METHOD
Publication number
20170299534
Publication date
Oct 19, 2017
Hamamatsu Photonics K.K.
Tomonori NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR INSPECTING INTEGRATED CIRCUIT
Publication number
20150293036
Publication date
Oct 15, 2015
Tomonori Nakamura
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE AND METHOD OF TESTING...
Publication number
20150153408
Publication date
Jun 4, 2015
HAMAMATSU PHOTONICS K. K.
Akihiro OTAKA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR INSPECTING INTEGRATED CIRCUIT
Publication number
20120307249
Publication date
Dec 6, 2012
HAMAMATSU PHOTONICS K. K.
Tomonori NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
Time-Resolved Measurement Apparatus
Publication number
20070267565
Publication date
Nov 22, 2007
Mitsunori Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
Time Resolution Measurement Device and Position Detection Election...
Publication number
20070263223
Publication date
Nov 15, 2007
Nobuyuki Hirai
H01 - BASIC ELECTRIC ELEMENTS