Nobuyuki INOUE

Follow

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical characteristics measuring method and optical characteristic...
- Patent number 10,733,750
- Issue date Aug 4, 2020
- Otsuka Electronics Co., Ltd.
- Yoshihiko Nishida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measurement method and optical measurement apparatus
- Patent number 10,429,238
- Issue date Oct 1, 2019
- Otsuka Electronics Co., Ltd.
- Nobuyuki Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus and optical measurement method
- Patent number 10,309,767
- Issue date Jun 4, 2019
- Otsuka Electronics Co., Ltd.
- Nobuyuki Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus and optical measurement method
- Patent number 10,288,412
- Issue date May 14, 2019
- Otsuka Electronics Co., Ltd.
- Nobuyuki Inoue
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL CHARACTERISTICS MEASURING METHOD AND OPTICAL CHARACTERISTIC...
- Publication number 20190139249
- Publication date May 9, 2019
- Otsuka Electronics Co., Ltd.
- Yoshihiko NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20180347965
- Publication date Dec 6, 2018
- Otsuka Electronics Co., Ltd.
- Nobuyuki INOUE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20180347964
- Publication date Dec 6, 2018
- Otsuka Electronics Co., Ltd.
- Nobuyuki INOUE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT METHOD AND OPTICAL MEASUREMENT APPARATUS
- Publication number 20180073923
- Publication date Mar 15, 2018
- Otsuka Electronics Co., Ltd.
- Nobuyuki INOUE
- G01 - MEASURING TESTING