Nobuyuki Iriki

Person

Kodaira, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Micropattern shape measuring system and method
- Patent number 7,130,063
- Issue date Oct 31, 2006
- Hitachi High-Technologies Corporation
- Yasuhiro Mitsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micropattern shape measuring system and method
- Patent number 6,894,790
- Issue date May 17, 2005
- Hitachi High-Technologies Corporation
- Yasuhiro Mitsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing and testing semiconductor integrated circui...
- Patent number 6,716,648
- Issue date Apr 6, 2004
- Renesas Technology Corp.
- Nobuyuki Iriki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device fabrication method and its...
- Patent number 5,497,331
- Issue date Mar 5, 1996
- Hitachi, Ltd.
- Nobuyuki Iriki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making semiconductor integrated circuit, pattern detectin...
- Patent number 5,432,608
- Issue date Jul 11, 1995
- Hitachi, Ltd.
- Susumu Komoriya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of making semiconductor integrated circuit, pattern detectin...
- Patent number 5,260,771
- Issue date Nov 9, 1993
- Hitachi, Ltd.
- Susumu Komoriya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of making semiconductor integrated circuit, pattern detectin...
- Patent number 5,094,539
- Issue date Mar 10, 1992
- Hitachi, Ltd.
- Susumu Komoriya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Micropattern shape measuring system and method
- Publication number 20050182595
- Publication date Aug 18, 2005
- Yasuhiro Mitsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micropattern shape measuring system and method
- Publication number 20030090684
- Publication date May 15, 2003
- Yasuhiro Mitsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing semiconductor integrated circuit device
- Publication number 20020081758
- Publication date Jun 27, 2002
- Nobuyuki Iriki
- H01 - BASIC ELECTRIC ELEMENTS

Nobuyuki Iriki

Person

Patents Grantslast 30 patents

Micropattern shape measuring system and method

Micropattern shape measuring system and method

Method of manufacturing and testing semiconductor integrated circui...

Semiconductor integrated circuit device fabrication method and its...

Method of making semiconductor integrated circuit, pattern detectin...

Method of making semiconductor integrated circuit, pattern detectin...

Method of making semiconductor integrated circuit, pattern detectin...

Patents Applicationslast 30 patents

Micropattern shape measuring system and method

Micropattern shape measuring system and method

Method of manufacturing semiconductor integrated circuit device