Nobuyuki NISHITA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement device and method for controlling measurement device
- Patent number 12,235,104
- Issue date Feb 25, 2025
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Information projecting system and information projecting method
- Patent number 12,181,282
- Issue date Dec 31, 2024
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Surveying system, point cloud data acquiring method, and point clou...
- Patent number 12,152,880
- Issue date Nov 26, 2024
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Marking system and marking method
- Patent number 12,013,239
- Issue date Jun 18, 2024
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Data management system and management method
- Patent number 12,007,962
- Issue date Jun 11, 2024
- Topcon Corporation
- Atsushi Doji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surveying instrument, pole having a reflective peripheral surface a...
- Patent number 12,000,701
- Issue date Jun 4, 2024
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Tilt detecting device and surveying instrument
- Patent number 11,940,274
- Issue date Mar 26, 2024
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Data management system, management method, and storage medium
- Patent number 11,868,325
- Issue date Jan 9, 2024
- Topcon Corporation
- Atsushi Doji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional information processing unit, apparatus having thr...
- Patent number 11,822,351
- Issue date Nov 21, 2023
- Topcon Corporation
- Nobuyuki Nishita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electro-optical distance meter
- Patent number 11,754,679
- Issue date Sep 12, 2023
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device
- Patent number 11,754,677
- Issue date Sep 12, 2023
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Leveling base, surveying instrument and surveying system
- Patent number 11,719,537
- Issue date Aug 8, 2023
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and control method of measurement apparatus
- Patent number 11,668,825
- Issue date Jun 6, 2023
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Surveying device and surveying method
- Patent number 11,644,575
- Issue date May 9, 2023
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system, measurement method, and measurement program
- Patent number 11,630,208
- Issue date Apr 18, 2023
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Target device and measuring system
- Patent number 11,630,186
- Issue date Apr 18, 2023
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Reflecting prism, measurement target object including reflecting pr...
- Patent number 11,585,900
- Issue date Feb 21, 2023
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Target instrument and surveying system
- Patent number 11,536,568
- Issue date Dec 27, 2022
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,500,096
- Issue date Nov 15, 2022
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and control method of measurement apparatus
- Patent number 11,460,297
- Issue date Oct 4, 2022
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Survey system
- Patent number 11,460,299
- Issue date Oct 4, 2022
- Topcon Corporation
- Nobuyuki Nishita
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Surveying device
- Patent number 11,448,504
- Issue date Sep 20, 2022
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,385,052
- Issue date Jul 12, 2022
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Survey system
- Patent number 11,333,764
- Issue date May 17, 2022
- Topcon Corporation
- Nobuyuki Nishita
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Surveying device, and calibration checking method and calibration c...
- Patent number 11,307,031
- Issue date Apr 19, 2022
- Topcon Corporation
- You Sasaki
- G02 - OPTICS
Information Patent Grant
Surveying instrument
- Patent number 11,293,754
- Issue date Apr 5, 2022
- TOPCON Corporation
- Satoshi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Survey system and method for identifying target
- Patent number 11,035,670
- Issue date Jun 15, 2021
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Surveying system
- Patent number 11,009,607
- Issue date May 18, 2021
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Data processing device, data processing method, and data processing...
- Patent number 10,969,493
- Issue date Apr 6, 2021
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Surveying system
- Patent number 10,895,632
- Issue date Jan 19, 2021
- Topcon Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURVEY SYSTEM
- Publication number 20240110783
- Publication date Apr 4, 2024
- TOPCON CORPORATION
- Nobuyuki NISHITA
- G01 - MEASURING TESTING
Information Patent Application
SURVEYING INSTRUMENT AND SURVEY SYSTEM
- Publication number 20240110784
- Publication date Apr 4, 2024
- TOPCON CORPORATION
- Akinobu SUGIURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SURVEYING APPARATUS, AND METHOD AND PROGRAM FOR OPERATING SURVEYING...
- Publication number 20240102800
- Publication date Mar 28, 2024
- TOPCON CORPORATION
- You SASAKI
- G01 - MEASURING TESTING
Information Patent Application
MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND MANAGEMENT STORAGE MEDIUM
- Publication number 20230315927
- Publication date Oct 5, 2023
- TOPCON CORPORATION
- Atsushi DOJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND MANAGEMENT STORAGE MEDIUM
- Publication number 20230315926
- Publication date Oct 5, 2023
- TOPCON CORPORATION
- Atsushi DOJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REFERENCE POINT INDICATING APPARATUS
- Publication number 20230243652
- Publication date Aug 3, 2023
- TOPCON CORPORATION
- Noriyasu Kiryuu
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE POINT INDICATING APPARATUS
- Publication number 20230243633
- Publication date Aug 3, 2023
- TOPCON Corporation
- Noriyasu Kiryuu
- G01 - MEASURING TESTING
Information Patent Application
TARGET SUPPORT TOOL
- Publication number 20230100796
- Publication date Mar 30, 2023
- TOPCON CORPORATION
- Nobuyuki NISHITA
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
SURVEYING SYSTEM
- Publication number 20230097350
- Publication date Mar 30, 2023
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Application
DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM
- Publication number 20230074990
- Publication date Mar 9, 2023
- TOPCON CORPORATION
- Atsushi DOJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM
- Publication number 20230045338
- Publication date Feb 9, 2023
- TOPCON CORPORATION
- Atsushi DOJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM
- Publication number 20230015599
- Publication date Jan 19, 2023
- TOPCON CORPORATION
- Atsushi DOJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROJECTING SYSTEM AND INFORMATION PROJECTING METHOD
- Publication number 20230019423
- Publication date Jan 19, 2023
- TOPCON CORPORATION
- Nobuyuki NISHITA
- G01 - MEASURING TESTING
Information Patent Application
DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM
- Publication number 20220414066
- Publication date Dec 29, 2022
- TOPCON CORPORATION
- Atsushi DOJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURVEYING SYSTEM, POINT CLOUD DATA ACQUIRING METHOD, AND POINT CLOU...
- Publication number 20220307833
- Publication date Sep 29, 2022
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Application
TILT ANALYSIS SYSTEM, TILT ANALYSIS METHOD, STORAGE MEDIUM STORING...
- Publication number 20220155068
- Publication date May 19, 2022
- TOPCON CORPORATION
- Kunpei KOMAGAMINE
- G01 - MEASURING TESTING
Information Patent Application
CONSTRUCTION MANAGEMENT SYSTEM, CONSTRUCTION MANAGEMENT METHOD, AND...
- Publication number 20220156427
- Publication date May 19, 2022
- TOPCON CORPORATION
- Yuki SENOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MARKING SYSTEM AND MARKING METHOD
- Publication number 20220099443
- Publication date Mar 31, 2022
- TOPCON CORPORATION
- Nobuyuki NISHITA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND METHOD FOR CONTROLLING MEASUREMENT DEVICE
- Publication number 20220090916
- Publication date Mar 24, 2022
- TOPCON CORPORATION
- Nobuyuki NISHITA
- G01 - MEASURING TESTING
Information Patent Application
CONSTRUCTION MEMBER MEASURING METHOD AND MEASUREMENT SYSTEM FOR THE...
- Publication number 20220035034
- Publication date Feb 3, 2022
- TOPCON CORPORATION
- Nobuyuki NISHITA
- G01 - MEASURING TESTING
Information Patent Application
Leveling Base, Surveying Instrument And Surveying System
- Publication number 20220034655
- Publication date Feb 3, 2022
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument And Surveying System
- Publication number 20210302162
- Publication date Sep 30, 2021
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Application
SURVEY INSTRUMENT INSTALLATION DEVICE
- Publication number 20210254975
- Publication date Aug 19, 2021
- TOPCON CORPORATION
- Noriyasu KIRYUU
- G01 - MEASURING TESTING
Information Patent Application
Tilt Detecting Device And Surveying Instrument
- Publication number 20210116241
- Publication date Apr 22, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying System
- Publication number 20210025707
- Publication date Jan 28, 2021
- TOPCON CORPORATION
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM
- Publication number 20200363530
- Publication date Nov 19, 2020
- TOPCON CORPORATION
- Nobuyuki NISHITA
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200326186
- Publication date Oct 15, 2020
- TOPCON Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200318963
- Publication date Oct 8, 2020
- TOPCON CORPORATION
- Satoshi Hirano
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200318966
- Publication date Oct 8, 2020
- TOPCON Corporation
- Satoshi Hirano
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20200309912
- Publication date Oct 1, 2020
- TOPCON CORPORATION
- Nobuyuki NISHITA
- G01 - MEASURING TESTING

Nobuyuki NISHITA

Person

Patents Grantslast 30 patents

Measurement device and method for controlling measurement device

Information projecting system and information projecting method

Surveying system, point cloud data acquiring method, and point clou...

Marking system and marking method

Data management system and management method

Surveying instrument, pole having a reflective peripheral surface a...

Tilt detecting device and surveying instrument

Data management system, management method, and storage medium

Three-dimensional information processing unit, apparatus having thr...

Electro-optical distance meter

Measurement device

Leveling base, surveying instrument and surveying system

Measurement apparatus and control method of measurement apparatus

Surveying device and surveying method

Measurement system, measurement method, and measurement program

Target device and measuring system

Reflecting prism, measurement target object including reflecting pr...

Target instrument and surveying system

Surveying instrument

Measurement apparatus and control method of measurement apparatus

Survey system

Surveying device

Surveying instrument

Survey system

Surveying device, and calibration checking method and calibration c...

Surveying instrument

Survey system and method for identifying target

Surveying system

Data processing device, data processing method, and data processing...

Surveying system

Patents Applicationslast 30 patents

SURVEY SYSTEM

SURVEYING INSTRUMENT AND SURVEY SYSTEM

SURVEYING APPARATUS, AND METHOD AND PROGRAM FOR OPERATING SURVEYING...

MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND MANAGEMENT STORAGE MEDIUM

MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND MANAGEMENT STORAGE MEDIUM

REFERENCE POINT INDICATING APPARATUS

REFERENCE POINT INDICATING APPARATUS

TARGET SUPPORT TOOL

SURVEYING SYSTEM

DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM

DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM

DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM

INFORMATION PROJECTING SYSTEM AND INFORMATION PROJECTING METHOD

DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM

SURVEYING SYSTEM, POINT CLOUD DATA ACQUIRING METHOD, AND POINT CLOU...

TILT ANALYSIS SYSTEM, TILT ANALYSIS METHOD, STORAGE MEDIUM STORING...

CONSTRUCTION MANAGEMENT SYSTEM, CONSTRUCTION MANAGEMENT METHOD, AND...

MARKING SYSTEM AND MARKING METHOD

MEASUREMENT DEVICE AND METHOD FOR CONTROLLING MEASUREMENT DEVICE

CONSTRUCTION MEMBER MEASURING METHOD AND MEASUREMENT SYSTEM FOR THE...

Leveling Base, Surveying Instrument And Surveying System

Surveying Instrument And Surveying System

SURVEY INSTRUMENT INSTALLATION DEVICE

Tilt Detecting Device And Surveying Instrument

Surveying System

MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM

Surveying Instrument

Surveying Instrument

Surveying Instrument

MEASUREMENT DEVICE