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Nobuyuki Takegawa
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Bunkyo-ku, JP
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Patents Grants
last 30 patents
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Patent Grant
Particle beam forming device
Patent number
9,574,984
Issue date
Feb 21, 2017
Fuji Electric Co., Ltd.
Naoki Takeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of analyzing microparticle composition and microparticle com...
Patent number
9,285,298
Issue date
Mar 15, 2016
The University of Tokyo
Nobuyuki Takegawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PARTICLE BEAM FORMING DEVICE
Publication number
20150260629
Publication date
Sep 17, 2015
The University of Tokyo
Naoki Takeda
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ANALYZING MICROPARTICLE COMPOSITION AND MICROPARTICLE COM...
Publication number
20130011930
Publication date
Jan 10, 2013
Fuji Electric Co., Ltd.
Nobuyuki Takegawa
G01 - MEASURING TESTING