Nobuyuki YAMAGUCHI

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Aomori, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electrical connecting apparatus
- Patent number 7,934,945
- Issue date May 3, 2011
- Kabushiki Kaisha Nihon Micronics
- Hisao Narita
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus and method for manufacturing the same
- Patent number 7,819,668
- Issue date Oct 26, 2010
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device probe card with improved probe grouping
- Patent number 7,791,364
- Issue date Sep 7, 2010
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus and method for use thereof
- Patent number 7,471,095
- Issue date Dec 30, 2008
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20100105224
- Publication date Apr 29, 2010
- Kabushiki Kaisha Nihon Micronics
- Hisao Narita
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20090140760
- Publication date Jun 4, 2009
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY
- Publication number 20080272796
- Publication date Nov 6, 2008
- Kabushiki Kaisha Nihon Micronics
- Nobuyuki Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080143362
- Publication date Jun 19, 2008
- Kabushiki Kaisha Nihon Micronics
- Satoshi NARITA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS AND METHOD FOR USE THEREOF
- Publication number 20080143369
- Publication date Jun 19, 2008
- Kabushiki Kaisha Nihon Micronics
- Satoshi NARITA
- G01 - MEASURING TESTING