Nodari Sitchinava

Person

San Mateo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,900,105
- Issue date Mar 1, 2011
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,836,367
- Issue date Nov 16, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,836,368
- Issue date Nov 16, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,774,663
- Issue date Aug 10, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,743,299
- Issue date Jun 22, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,596,733
- Issue date Sep 29, 2009
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,418,640
- Issue date Aug 26, 2008
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20100223516
- Publication date Sep 2, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20100031101
- Publication date Feb 4, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20090313514
- Publication date Dec 17, 2009
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20090271673
- Publication date Oct 29, 2009
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20080301510
- Publication date Dec 4, 2008
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20080294955
- Publication date Nov 27, 2008
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically reconfigurable shared scan-in test architecture
- Publication number 20050268190
- Publication date Dec 1, 2005
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING

Nodari Sitchinava

Person

Patents Grantslast 30 patents

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Patents Applicationslast 30 patents

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically reconfigurable shared scan-in test architecture