Noel S. Poduje

Person

Needham, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method, system, and software for evaluating characteristics of a su...
- Patent number 7,324,917
- Issue date Jan 29, 2008
- KLA-Tencor Technologies Corporation
- Chris L. Koliopoulos
- G01 - MEASURING TESTING
Information Patent Grant
Wafer gripping fingers to minimize distortion
- Patent number 7,175,214
- Issue date Feb 13, 2007
- ADE Corporation
- Jaydeep K. Sinha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for measurement system calibration
- Patent number 6,025,787
- Issue date Feb 15, 2000
- ADE Corporation
- Noel S. Poduje
- G01 - MEASURING TESTING
Information Patent Grant
Wafer transfer robot
- Patent number 5,988,971
- Issue date Nov 23, 1999
- ADE Optical Systems Corporation
- Michael E. Fossey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer testing and self-calibration system
- Patent number 5,642,298
- Issue date Jun 24, 1997
- ADE Corporation
- Roy E. Mallory
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for measurement system calibration
- Patent number 5,557,267
- Issue date Sep 17, 1996
- ADE Corporation
- Noel S. Poduje
- G01 - MEASURING TESTING
Information Patent Grant
Wafer handling and processing system
- Patent number 5,511,005
- Issue date Apr 23, 1996
- ADE Corporation
- Robert C. Abbe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robot prealigner
- Patent number 5,456,561
- Issue date Oct 10, 1995
- ADE Corporation
- Noel S. Poduje
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Robot prealigner
- Patent number 5,332,352
- Issue date Jul 26, 1994
- ADE Corporation
- Noel S. Poduje
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Robot prealigner
- Patent number 5,102,280
- Issue date Apr 7, 1992
- ADE Corporation
- Noel S. Poduje
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Prealigner probe
- Patent number 4,958,129
- Issue date Sep 18, 1990
- ADE Corporation
- Noel S. Poduje
- G01 - MEASURING TESTING
Information Patent Grant
A.C. capacitive gauging system
- Patent number 4,918,376
- Issue date Apr 17, 1990
- ADE Corporation
- Noel S. Poduje
- G01 - MEASURING TESTING
Information Patent Grant
Multi-probe grouping system with nonlinear error correction
- Patent number 4,910,453
- Issue date Mar 20, 1990
- ADE Corporation
- Robert C. Abbe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer flatness station
- Patent number 4,860,229
- Issue date Aug 22, 1989
- ADE Corporation
- Robert C. Abbe
- G01 - MEASURING TESTING
Information Patent Grant
Improved spatial resolution measurement system and method
- Patent number 4,849,916
- Issue date Jul 18, 1989
- ADE Corporation
- Robert C. Abbe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for separating fixture-induced error from meas...
- Patent number 4,750,141
- Issue date Jun 7, 1988
- ADE Corporation
- Neil H. Judell
- G01 - MEASURING TESTING
Information Patent Grant
Conductivity-type sensor
- Patent number 4,692,695
- Issue date Sep 8, 1987
- ADE Corporation
- Noel S. Poduje
- G01 - MEASURING TESTING
Information Patent Grant
Self inverting gauging system
- Patent number 4,353,029
- Issue date Oct 5, 1982
- ADE Corporation
- Robert C. Abbe
- G01 - MEASURING TESTING
Information Patent Grant
Second order correction in linearized proximity probe
- Patent number 4,228,392
- Issue date Oct 14, 1980
- ADE Corporation
- Robert C. Abbe
- G01 - MEASURING TESTING
Information Patent Grant
Self inverting gauging system
- Patent number 4,217,542
- Issue date Aug 12, 1980
- ADE Corporation
- Robert C. Abbe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer edge detection system
- Patent number 4,158,171
- Issue date Jun 12, 1979
- ADE Corporation
- Robert C. Abbe
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive thickness gauging for ungrounded elements
- Patent number 3,990,005
- Issue date Nov 2, 1976
- ADE Corporation
- Robert C. Abbe
- G01 - MEASURING TESTING
Information Patent Grant
Self-calibrating dimension gauge
- Patent number 3,986,109
- Issue date Oct 12, 1976
- ADE Corporation
- Noel S. Poduje
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method, system, and software for evaluating characteristics of a su...
- Publication number 20060004542
- Publication date Jan 5, 2006
- Chris L. Koliopoulos
- G01 - MEASURING TESTING
Information Patent Application
Wafer gripping fingers to minimize distortion
- Publication number 20050029823
- Publication date Feb 10, 2005
- ADE CORPORATION
- Jaydeep K. Sinha
- H01 - BASIC ELECTRIC ELEMENTS

Noel S. Poduje

Person

Patents Grantslast 30 patents

Method, system, and software for evaluating characteristics of a su...

Wafer gripping fingers to minimize distortion

Apparatus and methods for measurement system calibration

Wafer transfer robot

Wafer testing and self-calibration system

Apparatus and methods for measurement system calibration

Wafer handling and processing system

Robot prealigner

Robot prealigner

Robot prealigner

Prealigner probe

A.C. capacitive gauging system

Multi-probe grouping system with nonlinear error correction

Wafer flatness station

Improved spatial resolution measurement system and method

Method and apparatus for separating fixture-induced error from meas...

Conductivity-type sensor

Self inverting gauging system

Second order correction in linearized proximity probe

Self inverting gauging system

Wafer edge detection system

Capacitive thickness gauging for ungrounded elements

Self-calibrating dimension gauge

Patents Applicationslast 30 patents

Method, system, and software for evaluating characteristics of a su...

Wafer gripping fingers to minimize distortion