Nohong KWAK

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection method using pattern model
- Patent number 12,205,267
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF CLASSIFYING DEFECTS OF A PATTERN
- Publication number 20230281794
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Kihyun KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD USING PATTERN MODEL
- Publication number 20230115188
- Publication date Apr 13, 2023
- Samsung Electronics Co., Ltd.
- Nohong KWAK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETECTING MEASUREMENT ERROR OF SEM EQUIPMENT AND METHOD O...
- Publication number 20230043003
- Publication date Feb 9, 2023
- Samsung Electronics Co., Ltd.
- Nohong KWAK
- G06 - COMPUTING CALCULATING COUNTING