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Nojan Motamedi
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Thickness measurement of substrate using color metrology
Patent number
11,776,109
Issue date
Oct 3, 2023
Applied Materials, Inc.
Nojan Motamedi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Residue detection using a luminance histogram
Patent number
11,315,232
Issue date
Apr 26, 2022
Applied Materials, Inc.
Dominic J. Benvegnu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Thickness measurement of substrate using color metrology
Patent number
11,100,628
Issue date
Aug 24, 2021
Applied Materials, Inc.
Nojan Motamedi
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR FILM THICKNESS PREDICTION USING MACHINE-LEARNING
Publication number
20240185058
Publication date
Jun 6, 2024
Applied Materials, Inc.
Nojan Motamedi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
USING LIGHT COUPLING PROPERTIES FOR FILM DETECTION
Publication number
20220388111
Publication date
Dec 8, 2022
Applied Materials, Inc.
Nojan Motamedi
B24 - GRINDING POLISHING
Information
Patent Application
USING LIGHT COUPLING PROPERTIES FOR MACHINE-LEARNING-BASED FILM DET...
Publication number
20220388112
Publication date
Dec 8, 2022
Applied Materials, Inc.
Nojan Motamedi
B24 - GRINDING POLISHING
Information
Patent Application
PIXEL CLASSIFICATION OF FILM NON-UNIFORMITY BASED ON PROCESSING OF...
Publication number
20220285227
Publication date
Sep 8, 2022
Applied Materials, Inc.
Dominic J. Benvegnu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REGION CLASSIFICATION OF FILM NON-UNIFORMITY BASED ON PROCESSING OF...
Publication number
20220284562
Publication date
Sep 8, 2022
Applied Materials, Inc.
Dominic J. Benvegnu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Thickness Measurement of Substrate Using Color Metrology
Publication number
20210358113
Publication date
Nov 18, 2021
Applied Materials, Inc.
Nojan Motamedi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Thickness Measurement of Substrate Using Color Metrology
Publication number
20200258214
Publication date
Aug 13, 2020
Applied Materials, Inc.
Nojan Motamedi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Residue Detection Using A Luminance Histogram
Publication number
20200126211
Publication date
Apr 23, 2020
Dominic J. Benvegnu
G06 - COMPUTING CALCULATING COUNTING