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Norbert Haase
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Weixdorf, DE
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Patents Grants
last 30 patents
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Patent Grant
Method for dynamically monitoring a reticle
Patent number
7,304,721
Issue date
Dec 4, 2007
Infineon Technologies AG
Henning Haffner
G01 - MEASURING TESTING
Information
Patent Grant
Method for projection of a circuit pattern, which is arranged on a...
Patent number
7,252,913
Issue date
Aug 7, 2007
Infineon Technologies AG
Bernd Kochan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multispectral sensor device
Patent number
5,926,282
Issue date
Jul 20, 1999
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
Jens Knobloch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for dynamically monitoring a reticle
Publication number
20050125164
Publication date
Jun 9, 2005
Henning Haffner
G01 - MEASURING TESTING
Information
Patent Application
Method and device for control of the data flow on application of re...
Publication number
20050090925
Publication date
Apr 28, 2005
Infineon Technologies AG
Thomas Albrecht
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
Method for projection of a circuit pattern, which is arranged on a...
Publication number
20050050512
Publication date
Mar 3, 2005
Bernd Kochan
G06 - COMPUTING CALCULATING COUNTING