Norbert Rehm

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Memory cell signal window testing apparatus
- Patent number 6,999,887
- Issue date Feb 14, 2006
- Infineon Technologies AG
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Grant
Reducing effects of noise coupling in integrated circuits with memo...
- Patent number 6,920,059
- Issue date Jul 19, 2005
- Infineon Technologies Aktiengesellschaft
- Michael Jacob
- G11 - INFORMATION STORAGE
Information Patent Grant
Hybrid fuses for redundancy
- Patent number 6,906,969
- Issue date Jun 14, 2005
- Infineon Technologies Aktiengesellschaft
- Thomas Roehr
- G11 - INFORMATION STORAGE
Information Patent Grant
Sensing of memory integrated circuits
- Patent number 6,903,959
- Issue date Jun 7, 2005
- Infineon Technologies Aktiengesellschaft
- Thomas Roehr
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy in series grouped memory architecture
- Patent number 6,856,560
- Issue date Feb 15, 2005
- Infineon Technologies Aktiengesellschaft
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Grant
Variable capacitances for memory cells within a cell group
- Patent number 6,731,529
- Issue date May 4, 2004
- Infineon Technologies Aktiengesellschaft
- Michael Jacob
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Historical information storage for integrated circuits
- Patent number 6,707,699
- Issue date Mar 16, 2004
- Infineon Technologies Aktiengesellschaft
- Michael Klaus Jacob
- G11 - INFORMATION STORAGE
Information Patent Grant
Flexible redundancy for memories
- Patent number 6,687,171
- Issue date Feb 3, 2004
- Infineon Technologies Aktiengesellschaft
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory architecture
- Patent number 6,639,824
- Issue date Oct 28, 2003
- Infineon Technologies Aktiengesellschaft
- Joerg Wohlfahrt
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Reference circuit implemented to reduce the degradation of referenc...
- Publication number 20050063212
- Publication date Mar 24, 2005
- Michael Jacob
- G11 - INFORMATION STORAGE
Information Patent Application
Reliable ferro fuse cell
- Publication number 20050047189
- Publication date Mar 3, 2005
- Roehr Thomas
- G11 - INFORMATION STORAGE
Information Patent Application
Memory cell signal window testing apparatus
- Publication number 20050033541
- Publication date Feb 10, 2005
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Application
Reducing effects of noise coupling in integrated circuits with memo...
- Publication number 20040105293
- Publication date Jun 3, 2004
- Michael Jacob
- G11 - INFORMATION STORAGE
Information Patent Application
HISTORICAL INFORMATION STORAGE FOR INTEGRATED CIRCUITS
- Publication number 20040057273
- Publication date Mar 25, 2004
- Michael Klaus Jacob
- G11 - INFORMATION STORAGE
Information Patent Application
Hybrid fuses for redundancy
- Publication number 20040057293
- Publication date Mar 25, 2004
- Thomas Roehr
- G11 - INFORMATION STORAGE
Information Patent Application
SENSING OF MEMORY INTEGRATED CIRCUITS
- Publication number 20040057275
- Publication date Mar 25, 2004
- Thomas Roehr
- G11 - INFORMATION STORAGE
Information Patent Application
Variable capacitances for memory cells within a cell group
- Publication number 20030223263
- Publication date Dec 4, 2003
- Michael Jacob
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLEXIBLE REDUNDANCY FOR MEMORIES
- Publication number 20030202387
- Publication date Oct 30, 2003
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Application
Redundancy in chained memory architectures
- Publication number 20030202386
- Publication date Oct 30, 2003
- Norbert Rehm
- G11 - INFORMATION STORAGE

Norbert Rehm

Person

Patents Grantslast 30 patents

Memory cell signal window testing apparatus

Reducing effects of noise coupling in integrated circuits with memo...

Hybrid fuses for redundancy

Sensing of memory integrated circuits

Redundancy in series grouped memory architecture

Variable capacitances for memory cells within a cell group

Historical information storage for integrated circuits

Flexible redundancy for memories

Memory architecture

Patents Applicationslast 30 patents

Reference circuit implemented to reduce the degradation of referenc...

Reliable ferro fuse cell

Memory cell signal window testing apparatus

Reducing effects of noise coupling in integrated circuits with memo...

HISTORICAL INFORMATION STORAGE FOR INTEGRATED CIRCUITS

Hybrid fuses for redundancy

SENSING OF MEMORY INTEGRATED CIRCUITS

Variable capacitances for memory cells within a cell group

FLEXIBLE REDUNDANCY FOR MEMORIES

Redundancy in chained memory architectures