Norbert Rehm

Person

Apex, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test mode for programming rate and precharge time for DRAM activate...
- Patent number 7,539,911
- Issue date May 26, 2009
- Infineon Technologies AG
- Robert Perry
- G11 - INFORMATION STORAGE
Information Patent Grant
Random access memory including circuit to compress comparison results
- Patent number 7,457,177
- Issue date Nov 25, 2008
- Infineon Technologies AG
- Rob Perry
- G11 - INFORMATION STORAGE
Information Patent Grant
Simulating a floating wordline condition in a memory device, and re...
- Patent number 7,408,833
- Issue date Aug 5, 2008
- Infineon Technologies AG
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Grant
Test parallelism increase by tester controllable switching of chip...
- Patent number 7,362,632
- Issue date Apr 22, 2008
- Infineon Technologies AG
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Grant
Random access memory including first and second voltage sources
- Patent number 7,313,033
- Issue date Dec 25, 2007
- Infineon Technologies AG
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for selectively accessing and configuring indi...
- Patent number 7,299,388
- Issue date Nov 20, 2007
- Infineon Technologies, AG
- Rath Ung
- G11 - INFORMATION STORAGE
Information Patent Grant
Test mode for detecting a floating word line
- Patent number 7,170,804
- Issue date Jan 30, 2007
- Infineon Technologies AG
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Grant
Simulating a floating wordline condition in a memory device, and re...
- Patent number 7,085,191
- Issue date Aug 1, 2006
- Infineon Technologies AG
- Norbert Rehm
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Test parallelism increase by tester controllable switching of chip...
- Publication number 20070165469
- Publication date Jul 19, 2007
- Norbert Rehm
- G01 - MEASURING TESTING
Information Patent Application
Local wordline driver scheme to avoid fails due to floating wordlin...
- Publication number 20070165479
- Publication date Jul 19, 2007
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Application
Random access memory including circuit to compress comparison results
- Publication number 20070140024
- Publication date Jun 21, 2007
- Rob Perry
- G11 - INFORMATION STORAGE
Information Patent Application
Random access memory including first and second voltage sources
- Publication number 20070070683
- Publication date Mar 29, 2007
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for selectively accessing and configuring indi...
- Publication number 20070011518
- Publication date Jan 11, 2007
- Rath Ung
- G01 - MEASURING TESTING
Information Patent Application
Test mode for programming rate and precharge time for DRAM activate...
- Publication number 20060282718
- Publication date Dec 14, 2006
- Robert Perry
- G11 - INFORMATION STORAGE
Information Patent Application
Test mode for detecting a floating word line
- Publication number 20060221690
- Publication date Oct 5, 2006
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Application
Simulating a floating wordline condition in a memory device, and re...
- Publication number 20060209617
- Publication date Sep 21, 2006
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Application
Simulating a floating wordline condition in a memory device, and re...
- Publication number 20060087906
- Publication date Apr 27, 2006
- Norbert Rehm
- G11 - INFORMATION STORAGE

Norbert Rehm

Person

Patents Grantslast 30 patents

Test mode for programming rate and precharge time for DRAM activate...

Random access memory including circuit to compress comparison results

Simulating a floating wordline condition in a memory device, and re...

Test parallelism increase by tester controllable switching of chip...

Random access memory including first and second voltage sources

Method and apparatus for selectively accessing and configuring indi...

Test mode for detecting a floating word line

Simulating a floating wordline condition in a memory device, and re...

Patents Applicationslast 30 patents

Test parallelism increase by tester controllable switching of chip...

Local wordline driver scheme to avoid fails due to floating wordlin...

Random access memory including circuit to compress comparison results

Random access memory including first and second voltage sources

Method and apparatus for selectively accessing and configuring indi...

Test mode for programming rate and precharge time for DRAM activate...

Test mode for detecting a floating word line

Simulating a floating wordline condition in a memory device, and re...

Simulating a floating wordline condition in a memory device, and re...