Norbert Schomann

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Rellingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
IC testing methods and apparatus
- Patent number 8,327,205
- Issue date Dec 4, 2012
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ic Testing Methods and Apparatus
- Publication number 20090003424
- Publication date Jan 1, 2009
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING