Norbert Thyssen

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Image sensor and device for an image sensor
- Patent number 12,154,921
- Issue date Nov 26, 2024
- Infineon Technologies AG
- Ines Uhlig
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for wafer bonding and compound semiconductor wafer
- Patent number 12,068,296
- Issue date Aug 20, 2024
- Infineon Technologies AG
- Stefan Hampl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a buried cavity structure
- Patent number 10,784,147
- Issue date Sep 22, 2020
- Infineon Technologies AG
- Ines Uhlig
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
XMR sensors with high shape anisotropy
- Patent number 9,915,707
- Issue date Mar 13, 2018
- Infineon Technologies AG
- Juergen Zimmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
XMR sensors with high shape anisotropy
- Patent number 9,606,197
- Issue date Mar 28, 2017
- Infineon Technologies AG
- Juergen Zimmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral power semiconductor device and method for manufacturing a l...
- Patent number 9,202,910
- Issue date Dec 1, 2015
- Infineon Technologies Austria AG
- Anton Mauder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
XMR sensors with high shape anisotropy
- Patent number 9,146,287
- Issue date Sep 29, 2015
- Infineon Technologies AG
- Juergen Zimmer
- G01 - MEASURING TESTING
Information Patent Grant
Detector
- Patent number 8,017,902
- Issue date Sep 13, 2011
- Infineon Technologies AG
- Achim Gratz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR WAFER BONDING AND COMPOUND SEMICONDUCTOR WAFER
- Publication number 20220238501
- Publication date Jul 28, 2022
- Stefan Hampl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image Sensor and Device for an Image Sensor
- Publication number 20220052091
- Publication date Feb 17, 2022
- Ines Uhlig
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING A BURIED CAVITY STRUCTURE
- Publication number 20190027399
- Publication date Jan 24, 2019
- INFINEON TECHNOLOGIES AG
- Ines Uhlig
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
XMR SENSORS WITH HIGH SHAPE ANISOTROPY
- Publication number 20170160350
- Publication date Jun 8, 2017
- INFINEON TECHNOLOGIES AG
- Juergen Zimmer
- G01 - MEASURING TESTING
Information Patent Application
XMR SENSORS WITH HIGH SHAPE ANISOTROPY
- Publication number 20150355295
- Publication date Dec 10, 2015
- INFINEON TECHNOLOGIES AG
- Juergen Zimmer
- G01 - MEASURING TESTING
Information Patent Application
Lateral Power Semiconductor Device and Method for Manufacturing a L...
- Publication number 20140319610
- Publication date Oct 30, 2014
- Anton Mauder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
XMR SENSORS WITH HIGH SHAPE ANISOTROPY
- Publication number 20120119735
- Publication date May 17, 2012
- Juergen Zimmer
- G01 - MEASURING TESTING
Information Patent Application
Detector
- Publication number 20100148039
- Publication date Jun 17, 2010
- Achim Gratz
- G01 - MEASURING TESTING

Norbert Thyssen

Person

Patents Grantslast 30 patents

Image sensor and device for an image sensor

Method for wafer bonding and compound semiconductor wafer

Method for producing a buried cavity structure

XMR sensors with high shape anisotropy

XMR sensors with high shape anisotropy

Lateral power semiconductor device and method for manufacturing a l...

XMR sensors with high shape anisotropy

Detector

Patents Applicationslast 30 patents

METHOD FOR WAFER BONDING AND COMPOUND SEMICONDUCTOR WAFER

Image Sensor and Device for an Image Sensor

METHOD FOR PRODUCING A BURIED CAVITY STRUCTURE

XMR SENSORS WITH HIGH SHAPE ANISOTROPY

XMR SENSORS WITH HIGH SHAPE ANISOTROPY

Lateral Power Semiconductor Device and Method for Manufacturing a L...

XMR SENSORS WITH HIGH SHAPE ANISOTROPY

Detector