Noriaki IKEDA

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Niigata-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection apparatus
- Patent number 10,859,516
- Issue date Dec 8, 2020
- System Square Inc.
- Noriaki Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection system
- Patent number 9,865,424
- Issue date Jan 9, 2018
- SYSTEM SQUARE INC.
- Noriaki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package inspection system
- Patent number 9,733,384
- Issue date Aug 15, 2017
- System Square Inc.
- Atsushi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Package inspection system
- Patent number 9,541,499
- Issue date Jan 10, 2017
- SYSTEM SQUARE INC.
- Noriaki Ikeda
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL

Patents Applicationslast 30 patents

Information Patent Application
Electromagnetic wave detection module, electromagnetic wave detecti...
- Publication number 20200241150
- Publication date Jul 30, 2020
- System Square Inc.
- Noriaki IKEDA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20190212464
- Publication date Jul 11, 2019
- System Square Inc.
- Noriaki IKEDA
- G01 - MEASURING TESTING
Information Patent Application
PACKAGE INSPECTION SYSTEM
- Publication number 20160033404
- Publication date Feb 4, 2016
- SYSTEM SQUARE INC.
- Atsushi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
PACKAGE INSPECTION SYSTEM
- Publication number 20150241341
- Publication date Aug 27, 2015
- System Square Inc.
- Noriaki IKEDA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION SYSTEM
- Publication number 20150179391
- Publication date Jun 25, 2015
- System Square Inc.
- Noriaki IKEDA
- G01 - MEASURING TESTING
Information Patent Application
PACKAGE INSPECTION APPARATUS
- Publication number 20120327227
- Publication date Dec 27, 2012
- System Square Inc.
- Noriaki IKEDA
- G01 - MEASURING TESTING