Noriaki Mizuno

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope and measurement method for obtaining i...
- Patent number 10,879,035
- Issue date Dec 29, 2020
- Jeol Ltd.
- Noriaki Mizuno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Coordinate Linking System and Coordinate Linking Method
- Publication number 20220122277
- Publication date Apr 21, 2022
- JEOL Ltd.
- Yuichiro Oohori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning Electron Microscope and Measurement Method
- Publication number 20190228948
- Publication date Jul 25, 2019
- JEOL Ltd.
- Noriaki Mizuno
- H01 - BASIC ELECTRIC ELEMENTS