Noriaki NOJI

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Nagano-city, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor inspection device and method of inspecting a semicond...
- Patent number 12,106,986
- Issue date Oct 1, 2024
- Fuji Electric Co., Ltd.
- Noriaki Noji
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240339332
- Publication date Oct 10, 2024
- Fuji Electric Co., Ltd.
- Noriaki NOJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240339333
- Publication date Oct 10, 2024
- Fuji Electric Co., Ltd.
- Noriaki NOJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240290663
- Publication date Aug 29, 2024
- Fuji Electric Co., Ltd.
- Tatsuya HASHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND METHOD OF INSPECTING A SEMICOND...
- Publication number 20220115252
- Publication date Apr 14, 2022
- Fuji Electric Co., Ltd.
- Noriaki NOJI
- H01 - BASIC ELECTRIC ELEMENTS