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NORIAKI OYABU
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Osaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Scan device for microscope measurement instrument
Patent number
8,796,654
Issue date
Aug 5, 2014
Shimadzu Coporation
Masahiro Ohta
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for analyzing sample in liquid
Patent number
8,037,739
Issue date
Oct 18, 2011
Shimadzu Corporation
Masahiro Ota
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Atomic force microscope and interaction force measurement method us...
Patent number
7,975,316
Issue date
Jul 5, 2011
Osaka University
Masahiro Ota
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Probe position control system and method
Patent number
7,703,314
Issue date
Apr 27, 2010
Shimadzu Corporation
Masayuki Abe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Scan Device
Publication number
20110261352
Publication date
Oct 27, 2011
SHIMADZU CORPORATION
Masahiro Ohta
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING SAMPLE IN LIQUID
Publication number
20110048115
Publication date
Mar 3, 2011
Shimadzu Corporation
MASAHIRO OTA
G02 - OPTICS
Information
Patent Application
ATOMIC FORCE MICROSCOPE AND INTERACTION FORCE MEASUREMENT METHOD US...
Publication number
20100071099
Publication date
Mar 18, 2010
Masahiro Ota
G01 - MEASURING TESTING
Information
Patent Application
Probe position control system and method
Publication number
20070272005
Publication date
Nov 29, 2007
Shimadzu Corporation
Masayuki Abe
G01 - MEASURING TESTING