Noriaki Sakai

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for analyzing evolved gas
- Patent number 11,646,188
- Issue date May 9, 2023
- Hitachi High-Tech Science Corporation
- Ryusuke Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of mass analysis
- Patent number 10,969,319
- Issue date Apr 6, 2021
- Hitachi High-Tech Science Corporation
- Ryusuke Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Plastic reference material and method of manufacturing the same
- Patent number 10,866,168
- Issue date Dec 15, 2020
- Hitachi High-Tech Science Corporation
- Yoshihiro Hirano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer comprising a gas blowing mechanism
- Patent number 9,400,255
- Issue date Jul 26, 2016
- Hitachi High-Tech Science Corporation
- Hiroaki Nohara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 8,548,121
- Issue date Oct 1, 2013
- Sii Nano Technology Inc.
- Noriaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer and X-ray analysis method
- Patent number 7,970,101
- Issue date Jun 28, 2011
- SII NanoTechnology Inc.
- Noriaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Normalizing circuit of floating-point arithmetic circuit for two in...
- Patent number 5,075,882
- Issue date Dec 24, 1991
- NEC Corporation
- Noriaki Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vector mask operation control unit
- Patent number 4,852,049
- Issue date Jul 25, 1989
- NEC Corporation
- Noriaki Sakai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
- Publication number 20230307219
- Publication date Sep 28, 2023
- HITACHI HIGH-TECH CORPORATION
- Ryusuke HIROSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASTIC REFERENCE MATERIAL AND METHOD OF MANUFACTURING THE SAME
- Publication number 20190257722
- Publication date Aug 22, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshihiro HIRANO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ANALYZING EVOLVED GAS
- Publication number 20190027353
- Publication date Jan 24, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ryusuke HIROSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR AND METHOD OF MASS ANALYSIS
- Publication number 20190025173
- Publication date Jan 24, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ryusuke HIROSE
- G01 - MEASURING TESTING
Information Patent Application
PLASTIC REFERENCE MATERIAL AND MANUFACTURING METHOD THEREOF
- Publication number 20180275026
- Publication date Sep 27, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshihiro HIRANO
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Spectrometer
- Publication number 20140294143
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroaki Nohara
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20120230468
- Publication date Sep 13, 2012
- Noriaki Sakai
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER AND X-RAY ANALYSIS METHOD
- Publication number 20100046700
- Publication date Feb 25, 2010
- Noriaki Sakai
- G01 - MEASURING TESTING

Noriaki Sakai

Person

Patents Grantslast 30 patents

Apparatus and method for analyzing evolved gas

Apparatus for and method of mass analysis

Plastic reference material and method of manufacturing the same

X-ray fluorescence spectrometer comprising a gas blowing mechanism

X-ray analyzer

X-ray analyzer and X-ray analysis method

Normalizing circuit of floating-point arithmetic circuit for two in...

Vector mask operation control unit

Patents Applicationslast 30 patents

MASS SPECTROMETRY METHOD AND MASS SPECTROMETER

PLASTIC REFERENCE MATERIAL AND METHOD OF MANUFACTURING THE SAME

APPARATUS AND METHOD FOR ANALYZING EVOLVED GAS

APPARATUS FOR AND METHOD OF MASS ANALYSIS

PLASTIC REFERENCE MATERIAL AND MANUFACTURING METHOD THEREOF

X-Ray Fluorescence Spectrometer

X-RAY ANALYZER

X-RAY ANALYZER AND X-RAY ANALYSIS METHOD