Noriaki Shimasaki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Connection board, probe card, and electronic device test apparatus...
- Patent number 8,134,381
- Issue date Mar 13, 2012
- Advantest Corporation
- Yoshihiro Abe
- G01 - MEASURING TESTING
Information Patent Grant
IC testing device adapted to selectively use I/O common system and...
- Patent number 6,020,752
- Issue date Feb 1, 2000
- Advantest Corporation
- Noriaki Shimasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONNECTION BOARD, PROBE CARD, AND ELECTRONIC DEVICE TEST APPARATUS...
- Publication number 20100102837
- Publication date Apr 29, 2010
- Advantest Corporation
- Yoshihiro Abe
- G01 - MEASURING TESTING