Noriaki Yukawa

Person

Nara, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of erasing repeated patterns and pattern defect inspection d...
- Patent number 6,909,798
- Issue date Jun 21, 2005
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of detecting pattern defects
- Patent number 6,714,671
- Issue date Mar 30, 2004
- Matsushita Electric Industrial Co., Ltd.
- Koichi Wakitani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High-resolution image pickup method and apparatus therefor
- Patent number 6,256,066
- Issue date Jul 3, 2001
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Display screen inspection method
- Patent number 5,966,458
- Issue date Oct 12, 1999
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of extracting pixels constituting intensity changes in an im...
- Patent number 5,682,440
- Issue date Oct 28, 1997
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining attributes using neural network and fuzzy logic
- Patent number 5,655,031
- Issue date Aug 5, 1997
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of detecting focus position of object from variable gray lev...
- Patent number 5,621,822
- Issue date Apr 15, 1997
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Line image processing method
- Patent number 5,537,490
- Issue date Jul 16, 1996
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Object extracting method
- Patent number 5,475,492
- Issue date Dec 12, 1995
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign matter detection device
- Patent number 5,331,396
- Issue date Jul 19, 1994
- Matsushita Electric Industrial Co., Ltd.
- Noriaki Yukawa
- G01 - MEASURING TESTING

Noriaki Yukawa

Person

Patents Grantslast 30 patents

Method of erasing repeated patterns and pattern defect inspection d...

Method of detecting pattern defects

High-resolution image pickup method and apparatus therefor

Display screen inspection method

Method of extracting pixels constituting intensity changes in an im...

Method for determining attributes using neural network and fuzzy logic

Method of detecting focus position of object from variable gray lev...

Line image processing method

Object extracting method

Foreign matter detection device