Norihiko Sugita

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Ann Arbor, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and its test method
- Patent number 7,982,217
- Issue date Jul 19, 2011
- Renesas Electronics Corporation
- Norihiko Sugita
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and method for manufacturing the same
- Patent number 7,026,188
- Issue date Apr 11, 2006
- Renesas Technology Corp.
- Kazuyuki Taguchi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,815,746
- Issue date Nov 9, 2004
- Renesas Technology Corp.
- Makoto Suzuki
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device and its test method
- Publication number 20050099199
- Publication date May 12, 2005
- Norihiko Sugita
- G01 - MEASURING TESTING
Information Patent Application
Electronic device and method for manufacturing the same
- Publication number 20040235221
- Publication date Nov 25, 2004
- Kazuyuki Taguchi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20030075797
- Publication date Apr 24, 2003
- Makoto Suzuki
- G11 - INFORMATION STORAGE