Norihiro MUROYAMA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
- Patent number 11,841,334
- Issue date Dec 12, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative phase analysis device for analyzing non-crystalline ph...
- Patent number 11,402,341
- Issue date Aug 2, 2022
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...
- Publication number 20240133829
- Publication date Apr 25, 2024
- Rigaku Corporation
- Takumi OTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Quantitative Phase Analysis Device For Analyzing Non-Crystalline Ph...
- Publication number 20210018452
- Publication date Jan 21, 2021
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE PHASE ANALYSIS DEVICE, QUANTITATIVE PHASE ANALYSIS MET...
- Publication number 20200173938
- Publication date Jun 4, 2020
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING