Norihiro OTA

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Contact, inspection jig, inspection device, and method of manufactu...
- Patent number 12,135,336
- Issue date Nov 5, 2024
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection device
- Patent number 12,055,561
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Norihiro Ota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact terminal, inspection jig, and inspection apparatus
- Patent number 12,055,562
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Yusuke Yokota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact terminal, inspection jig, and inspection device
- Patent number 12,013,416
- Issue date Jun 18, 2024
- Nidec-Read Corporation
- Michio Kaida
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig, inspection device, and contact terminal
- Patent number 11,467,186
- Issue date Oct 11, 2022
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and electrical connection jig
- Patent number 11,415,599
- Issue date Aug 16, 2022
- Nidec-Read Corporation
- Masami Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig, and inspection device including the same
- Patent number 11,327,094
- Issue date May 10, 2022
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig provided with probe, substrate inspection device pro...
- Patent number 10,914,758
- Issue date Feb 9, 2021
- Nidec-Read Corporation
- Hidekazu Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig, substrate inspection device, and method for manufac...
- Patent number 10,877,069
- Issue date Dec 29, 2020
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig and inspection device
- Patent number 10,877,085
- Issue date Dec 29, 2020
- Nidec-Read Corporation
- Toshihiko Kanai
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe
- Patent number 10,782,317
- Issue date Sep 22, 2020
- Nidec-Read Corporation
- Masami Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection device
- Patent number 10,656,179
- Issue date May 19, 2020
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection device
- Patent number 10,649,005
- Issue date May 12, 2020
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection apparatus
- Patent number 10,649,004
- Issue date May 12, 2020
- Nidec-Read Corporation
- Norihiro Ota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection jig
- Patent number 9,733,299
- Issue date Aug 15, 2017
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TUBULAR BODY, CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPA...
- Publication number 20230349946
- Publication date Nov 2, 2023
- Nidec-Read Corporation
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT, INSPECTION JIG, INSPECTION DEVICE, AND METHOD OF MANUFACTU...
- Publication number 20230349950
- Publication date Nov 2, 2023
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS
- Publication number 20230176089
- Publication date Jun 8, 2023
- NIDEC-READ CORPORATION
- Yusuke YOKOTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE
- Publication number 20220178968
- Publication date Jun 9, 2022
- Nidec-Read Corporation
- Yusuke YOKOTA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE
- Publication number 20220155345
- Publication date May 19, 2022
- NIDEC-READ CORPORATION
- Norihiro OTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE
- Publication number 20220155346
- Publication date May 19, 2022
- NIDEC-READ CORPORATION
- Michio KAIDA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS
- Publication number 20220026481
- Publication date Jan 27, 2022
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG, INSPECTION DEVICE, AND CONTACT TERMINAL
- Publication number 20210364553
- Publication date Nov 25, 2021
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG, AND INSPECTION DEVICE INCLUDING THE SAME
- Publication number 20210063438
- Publication date Mar 4, 2021
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING MI ELEMENT AND MI ELEMENT
- Publication number 20200300930
- Publication date Sep 24, 2020
- Masami YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION JIG, METHOD FOR MANUFACTURING INSPECTION JIG, AND INSPEC...
- Publication number 20200200797
- Publication date Jun 25, 2020
- NIDEC-READ CORPORATION
- Hidekazu YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND ELECTRICAL CONNECTION JIG
- Publication number 20190383858
- Publication date Dec 19, 2019
- NIDEC-READ CORPORATION
- Masami YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE
- Publication number 20190346485
- Publication date Nov 14, 2019
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG AND INSPECTION DEVICE
- Publication number 20190302170
- Publication date Oct 3, 2019
- NIDEC-READ CORPORATION
- Toshihiko KANAI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG, SUBSTRATE INSPECTION DEVICE PROVIDED WITH SAME, AND...
- Publication number 20190271722
- Publication date Sep 5, 2019
- NIDEC-READ CORPORATION
- Hidekazu YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG, SUBSTRATE INSPECTION DEVICE, AND METHOD FOR MANUFAC...
- Publication number 20190265276
- Publication date Aug 29, 2019
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE
- Publication number 20190178910
- Publication date Jun 13, 2019
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS
- Publication number 20190011479
- Publication date Jan 10, 2019
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE
- Publication number 20180340960
- Publication date Nov 29, 2018
- NIDEC-READ CORPORATION
- Masami YAMAMOTO
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
INSPECTION JIG
- Publication number 20150123693
- Publication date May 7, 2015
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING

Norihiro OTA

Person

Patents Grantslast 30 patents

Contact, inspection jig, inspection device, and method of manufactu...

Contact terminal, inspection jig, and inspection device

Contact terminal, inspection jig, and inspection apparatus

Contact terminal, inspection jig, and inspection device

Inspection jig, inspection device, and contact terminal

Contact probe and electrical connection jig

Inspection jig, and inspection device including the same

Inspection jig provided with probe, substrate inspection device pro...

Inspection jig, substrate inspection device, and method for manufac...

Inspection jig and inspection device

Contact probe

Contact terminal, inspection jig, and inspection device

Contact terminal, inspection jig, and inspection device

Contact terminal, inspection jig, and inspection apparatus

Inspection jig

Patents Applicationslast 30 patents

TUBULAR BODY, CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPA...

CONTACT, INSPECTION JIG, INSPECTION DEVICE, AND METHOD OF MANUFACTU...

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS

INSPECTION JIG, INSPECTION DEVICE, AND CONTACT TERMINAL

INSPECTION JIG, AND INSPECTION DEVICE INCLUDING THE SAME

METHOD FOR PRODUCING MI ELEMENT AND MI ELEMENT

INSPECTION JIG, METHOD FOR MANUFACTURING INSPECTION JIG, AND INSPEC...

CONTACT PROBE AND ELECTRICAL CONNECTION JIG

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE

INSPECTION JIG AND INSPECTION DEVICE

INSPECTION JIG, SUBSTRATE INSPECTION DEVICE PROVIDED WITH SAME, AND...

INSPECTION JIG, SUBSTRATE INSPECTION DEVICE, AND METHOD FOR MANUFAC...

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS

CONTACT PROBE

INSPECTION JIG