Norihisa Mori

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image processing device, analysis device, and image processing meth...
- Patent number 10,746,675
- Issue date Aug 18, 2020
- Jeol Ltd.
- Norihisa Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus, surface analyzer, and image processing...
- Patent number 10,593,072
- Issue date Mar 17, 2020
- Jeol Ltd.
- Naoki Katoh
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus, image processing method, and analyzer
- Patent number 10,482,579
- Issue date Nov 19, 2019
- Jeol Ltd.
- Norihisa Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scatter diagram display device and surface analyzer
- Patent number 9,874,532
- Issue date Jan 23, 2018
- Jeol Ltd.
- Norihisa Mori
- G01 - MEASURING TESTING
Information Patent Grant
Phase analyzer, phase analysis method, and surface analyzer
- Patent number 9,518,942
- Issue date Dec 13, 2016
- Jeol Ltd.
- Naoki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radioactive iodine adsorbent and radioactive iodine removal apparatus
- Patent number 9,044,737
- Issue date Jun 2, 2015
- Mitsubishi Heavy Industries, Ltd.
- Norihisa Mori
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Leak testing method and leak testing device for iodine filter
- Patent number 8,919,184
- Issue date Dec 30, 2014
- Mitsubishi Heavy Industries, Ltd.
- Norihisa Mori
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam system and method of operating the same
- Patent number 7,569,819
- Issue date Aug 4, 2009
- Jeol Ltd.
- Norihisa Mori
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Image Processing Device, Analysis Device, and Image Processing Method
- Publication number 20190041343
- Publication date Feb 7, 2019
- JEOL Ltd.
- Norihisa Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Processing Apparatus, Surface Analyzer, and Image Processing...
- Publication number 20180342087
- Publication date Nov 29, 2018
- JEOL Ltd.
- Naoki Katoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Processing Apparatus, Image Processing Method, and Analyzer
- Publication number 20180047138
- Publication date Feb 15, 2018
- JEOL Ltd.
- Norihisa Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scatter Diagram Display Device and Surface Analyzer
- Publication number 20160110896
- Publication date Apr 21, 2016
- JEOL Ltd.
- Norihisa Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Phase Analyzer, Phase Analysis Method, and Surface Analyzer
- Publication number 20150362446
- Publication date Dec 17, 2015
- JEOL Ltd.
- Naoki Kato
- G01 - MEASURING TESTING
Information Patent Application
RADIOACTIVE IODINE ADSORBENT AND RADIOACTIVE IODINE REMOVAL APPARATUS
- Publication number 20130068102
- Publication date Mar 21, 2013
- Mitsubishi Heavy Industries, Ltd.
- Norihisa Mori
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
LEAK TESTING METHOD AND LEAK TESTING DEVICE FOR IODINE FILTER
- Publication number 20130047707
- Publication date Feb 28, 2013
- Mitsubishi Heavy Industries, Ltd.
- Norihisa Mori
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam System and Method of Operating the Same
- Publication number 20080087821
- Publication date Apr 17, 2008
- JEOL Ltd.
- Norihisa Mori
- H01 - BASIC ELECTRIC ELEMENTS

Norihisa Mori

Person

Patents Grantslast 30 patents

Image processing device, analysis device, and image processing meth...

Image processing apparatus, surface analyzer, and image processing...

Image processing apparatus, image processing method, and analyzer

Scatter diagram display device and surface analyzer

Phase analyzer, phase analysis method, and surface analyzer

Radioactive iodine adsorbent and radioactive iodine removal apparatus

Leak testing method and leak testing device for iodine filter

Electron beam system and method of operating the same

Patents Applicationslast 30 patents

Image Processing Device, Analysis Device, and Image Processing Method

Image Processing Apparatus, Surface Analyzer, and Image Processing...

Image Processing Apparatus, Image Processing Method, and Analyzer

Scatter Diagram Display Device and Surface Analyzer

Phase Analyzer, Phase Analysis Method, and Surface Analyzer

RADIOACTIVE IODINE ADSORBENT AND RADIOACTIVE IODINE REMOVAL APPARATUS

LEAK TESTING METHOD AND LEAK TESTING DEVICE FOR IODINE FILTER

Electron Beam System and Method of Operating the Same