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Norik JANUNTS
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Jena, DE
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last 30 patents
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Patent Grant
Wafer-level test method for optoelectronic chips
Patent number
11,906,579
Issue date
Feb 20, 2024
JENOPTIK GmbH
Tobias Gnausch
G01 - MEASURING TESTING
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Patent Grant
Assembly for detecting the intensity distribution of components of...
Patent number
11,162,976
Issue date
Nov 2, 2021
Norik Janunts
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
Publication number
20220397602
Publication date
Dec 15, 2022
Tobias GNAUSCH
G01 - MEASURING TESTING
Information
Patent Application
Assembly for Detecting the Intensity Distribution of Components of...
Publication number
20210263070
Publication date
Aug 26, 2021
Norik JANUNTS
G01 - MEASURING TESTING