Norikazu Ohta

Person

Aichi-gun, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Capacitive sensor device
- Patent number 8,310,248
- Issue date Nov 13, 2012
- Denso Corporation
- Keisuke Gotoh
- G01 - MEASURING TESTING
Information Patent Grant
Peak voltage detector circuit and binarizing circuit including the...
- Patent number 8,008,948
- Issue date Aug 30, 2011
- Denso Corporation
- Yasuaki Makino
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing magnetic sensor apparatus
- Patent number 7,582,489
- Issue date Sep 1, 2009
- Denso Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Grant
Clock signal output circuit
- Patent number 7,560,998
- Issue date Jul 14, 2009
- Kabushiki Kaisha Toyoto Chuo Kenkyusho
- Norikazu Ohta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Magnetic impedance device, sensor apparatus using the same and meth...
- Patent number 7,417,269
- Issue date Aug 26, 2008
- Denso Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for outputting stable reference voltage against variation o...
- Patent number 7,233,136
- Issue date Jun 19, 2007
- Denso Corporation
- Yasuaki Makino
- G05 - CONTROLLING REGULATING
Information Patent Grant
METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF SENSOR...
- Patent number 6,809,527
- Issue date Oct 26, 2004
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive sensor apparatus
- Patent number 6,744,258
- Issue date Jun 1, 2004
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive physical load sensor and detection system
- Patent number 6,647,795
- Issue date Nov 18, 2003
- Denso Corporation
- Yasutoshi Suzuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Capacitive sensor device
- Publication number 20100219848
- Publication date Sep 2, 2010
- DENSO CORPORATION
- Keisuke Gotoh
- G01 - MEASURING TESTING
Information Patent Application
Noise removal circuit and comparator circuit including same
- Publication number 20090002033
- Publication date Jan 1, 2009
- DENSO CORPORATION
- Shinji Nakatani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Peak voltage detector circuit and binarizing circuit including the...
- Publication number 20080211544
- Publication date Sep 4, 2008
- DENSO CORPORATION
- Yasuaki Makino
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing magnetic sensor apparatus
- Publication number 20080145956
- Publication date Jun 19, 2008
- DENSO CORPORATION
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Peak voltage detector circuit and binarizing circuit including the...
- Publication number 20080048641
- Publication date Feb 28, 2008
- DENSO CORPORATION
- Yasuaki Makino
- G01 - MEASURING TESTING
Information Patent Application
Binarization circuit
- Publication number 20070285291
- Publication date Dec 13, 2007
- DENSO CORPORATION
- Yasuaki Makino
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Clock signal output circuit
- Publication number 20070146072
- Publication date Jun 28, 2007
- KABUSHIKI KAISHA TOYOTA CHUO KENKYUSHO
- Norikazu Ohta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Magnetic impedance device, sensor apparatus using the same and meth...
- Publication number 20070108970
- Publication date May 17, 2007
- DENSO CORPORATION
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Reference voltage circuit
- Publication number 20060176043
- Publication date Aug 10, 2006
- DENSO CORPORATION
- Yasuaki Makino
- G05 - CONTROLLING REGULATING
Information Patent Application
Magnetic impedance device, sensor apparatus using the same and meth...
- Publication number 20040131887
- Publication date Jul 8, 2004
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Capacitive sensor apparatus
- Publication number 20030011378
- Publication date Jan 16, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring a characteristic of a capacitive type of sensor...
- Publication number 20030011384
- Publication date Jan 16, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Capacitive physical load sensor and detection system
- Publication number 20020178828
- Publication date Dec 5, 2002
- Yasutoshi Suzuki
- G01 - MEASURING TESTING

Norikazu Ohta

Person

Patents Grantslast 30 patents

Capacitive sensor device

Peak voltage detector circuit and binarizing circuit including the...

Method for manufacturing magnetic sensor apparatus

Clock signal output circuit

Magnetic impedance device, sensor apparatus using the same and meth...

Circuit for outputting stable reference voltage against variation o...

METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF SENSOR...

Capacitive sensor apparatus

Capacitive physical load sensor and detection system

Patents Applicationslast 30 patents

Capacitive sensor device

Noise removal circuit and comparator circuit including same

Peak voltage detector circuit and binarizing circuit including the...

Method for manufacturing magnetic sensor apparatus

Peak voltage detector circuit and binarizing circuit including the...

Binarization circuit

Clock signal output circuit

Magnetic impedance device, sensor apparatus using the same and meth...

Reference voltage circuit

Magnetic impedance device, sensor apparatus using the same and meth...

Capacitive sensor apparatus

Method of measuring a characteristic of a capacitive type of sensor...

Capacitive physical load sensor and detection system