Noriko Hirano

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining minute amounts of additives in polymers
- Patent number 8,796,033
- Issue date Aug 5, 2014
- Mitsubishi Denki Kabushiki Kaisha
- Jiro Naka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for recovering impurities from a silicon wafer
- Patent number 6,182,675
- Issue date Feb 6, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Jiro Naka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ANALYZING MINUTE QUANTITY OF CONTENT
- Publication number 20100108875
- Publication date May 6, 2010
- Mitsubishi Denki Kabushiki Kaisha
- Jiro Naka
- G01 - MEASURING TESTING