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Noriko IIZUMI
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Electrochemical measurement device
Patent number
10,018,586
Issue date
Jul 10, 2018
Hitachi High-Technologies Corporation
Shinya Matsuoka
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam apparatus, specimen observation system and op...
Patent number
9,792,832
Issue date
Oct 17, 2017
Hitachi High-Technologies Corporation
Yayoi Konishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic analyzer
Patent number
9,297,820
Issue date
Mar 29, 2016
Hitachi High-Technologies Corporation
Noriko Iizumi
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
9,058,957
Issue date
Jun 16, 2015
Hitachi High-Technologies Corporation
Kunji Shigeto
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ELECTROCHEMICAL MEASUREMENT DEVICE
Publication number
20150355140
Publication date
Dec 10, 2015
Hitachi High-Technologies Corporation
Shinya MATSUOKA
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
Publication number
20150074523
Publication date
Mar 12, 2015
Hitachi High-Technologies Corporation
Yayoi Konishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS
Publication number
20140131590
Publication date
May 15, 2014
Kunji Shigeto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20090202390
Publication date
Aug 13, 2009
Noriko IIZUMI
G01 - MEASURING TESTING