Norimichi CHINONE

Follow

Person

Hamamatsu-shi, Shizuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 12,222,387
- Issue date Feb 11, 2025
- Hamamatsu Photonics K.K.
- Norimichi Chinone
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20230184827
- Publication date Jun 15, 2023
- Hamamatsu Photonics K.K.
- Norimichi CHINONE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20230184825
- Publication date Jun 15, 2023
- Hamamatsu Photonics K.K.
- Norimichi CHINONE
- G01 - MEASURING TESTING