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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and method for controlling focus position thereof
- Patent number 6,984,823
- Issue date Jan 10, 2006
- Riken
- Masaya Iwaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron microscope and method for controlling focus position thereof
- Publication number 20040174588
- Publication date Sep 9, 2004
- Masaya Iwaki
- H01 - BASIC ELECTRIC ELEMENTS