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Norio Funahashi
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Tokyo, JP
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last 30 patents
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Patent Grant
Frequency detection circuit
Patent number
6,043,749
Issue date
Mar 28, 2000
NEC Corporation
Hirofumi Saito
G01 - MEASURING TESTING
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Patent Grant
Semiconductor device
Patent number
6,028,335
Issue date
Feb 22, 2000
NEC Corporation
Yuji Okamoto
G11 - INFORMATION STORAGE
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Patent Grant
Non-volatile semiconductor memory device having an improved testing...
Patent number
5,086,413
Issue date
Feb 4, 1992
NEC Corporation
Toshihide Tsuboi
G11 - INFORMATION STORAGE