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Norio Ishikawa
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Osaka-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Support apparatus for optical characteristic measurement, and progr...
Patent number
7,668,408
Issue date
Feb 23, 2010
Konica Minolta Sensing, Inc.
Naoki Kimura
G01 - MEASURING TESTING
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Patent Grant
Standard plane sample and optical characteristic measurement system
Patent number
7,385,701
Issue date
Jun 10, 2008
Konica Minolta Sensing, Inc.
Koji Watanabe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Support apparatus for optical characteristic measurement, and progr...
Publication number
20060229838
Publication date
Oct 12, 2006
KONICA MINOLTA SENSING, INC.
Naoki Kimura
G01 - MEASURING TESTING
Information
Patent Application
Standard plane sample and optical characteristic measurement system
Publication number
20060109458
Publication date
May 25, 2006
KONICA MINOLTA SENSING, INC.
Koji Watanabe
G01 - MEASURING TESTING