Norio Ookubo

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and scanning method
- Patent number 7,874,016
- Issue date Jan 18, 2011
- SII Nano Technology Inc.
- Takeshi Umemoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning type probe microscope
- Patent number 7,588,605
- Issue date Sep 15, 2009
- SII NanoTechnology Inc.
- Norio Ookubo
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with probe formed by single conductive ma...
- Patent number 6,888,135
- Issue date May 3, 2005
- NEC Corporation
- Yuichi Naitou
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial probe with cantilever and scanning micro-wave microscope in...
- Patent number 6,715,345
- Issue date Apr 6, 2004
- NEC Corporation
- Norio Ookubo
- G01 - MEASURING TESTING
Information Patent Grant
Scanning microwave microscope capable of realizing high resolution...
- Patent number 6,614,227
- Issue date Sep 2, 2003
- NEC Corporation
- Norio Ookubo
- G01 - MEASURING TESTING
Information Patent Grant
Object-displacement detector and object-displacement controller
- Patent number 6,515,754
- Issue date Feb 4, 2003
- NEC Corporation
- Norio Ookubo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Microwave resonator and microwave microscope including the same
- Publication number 20100045306
- Publication date Feb 25, 2010
- Norio Ookubo
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope and Scanning Method
- Publication number 20080156988
- Publication date Jul 3, 2008
- Takeshi Umemoto
- G01 - MEASURING TESTING
Information Patent Application
Scanning Type Probe Microscope
- Publication number 20080048114
- Publication date Feb 28, 2008
- Norio Ookubo
- G01 - MEASURING TESTING
Information Patent Application
Coaxial probe and scanning micro-wave microscope including the same
- Publication number 20030034453
- Publication date Feb 20, 2003
- NEC Corporation
- Norio Ookubo
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe microscope and method of processing signals in the same
- Publication number 20020178802
- Publication date Dec 5, 2002
- Norio Ookubo
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning microwave microscope capable of realizing high resolution...
- Publication number 20020067170
- Publication date Jun 6, 2002
- NEC Corporation
- Norio Ookubo
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe microscope with probe formed by single conductive ma...
- Publication number 20020043101
- Publication date Apr 18, 2002
- NEC Corporation
- Yuichi Naitou
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe microscope and method of processing signals in the same
- Publication number 20010055151
- Publication date Dec 27, 2001
- AMANO PATENT AGENCY
- Norio Ookubo
- B82 - NANO-TECHNOLOGY
Information Patent Application
Object-displacement detector and object-displacement controller
- Publication number 20010052984
- Publication date Dec 20, 2001
- NEC Corporation
- Norio Ookubo
- G01 - MEASURING TESTING

Norio Ookubo

Person

Patents Grantslast 30 patents

Scanning probe microscope and scanning method

Scanning type probe microscope

Scanning probe microscope with probe formed by single conductive ma...

Coaxial probe with cantilever and scanning micro-wave microscope in...

Scanning microwave microscope capable of realizing high resolution...

Object-displacement detector and object-displacement controller

Patents Applicationslast 30 patents

Microwave resonator and microwave microscope including the same

Scanning Probe Microscope and Scanning Method

Scanning Type Probe Microscope

Coaxial probe and scanning micro-wave microscope including the same

Scanning probe microscope and method of processing signals in the same

Scanning microwave microscope capable of realizing high resolution...

Scanning probe microscope with probe formed by single conductive ma...

Scanning probe microscope and method of processing signals in the same

Object-displacement detector and object-displacement controller