Membership
Tour
Register
Log in
Norio Oowada
Follow
Person
Naka, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Flow type particle image analysis method and device
Patent number
8,831,306
Issue date
Sep 9, 2014
Hitachi High-Technologies Corporation
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Grant
Particle image analysis method and apparatus
Patent number
8,538,119
Issue date
Sep 17, 2013
Hitachi High-Technologies Corporation
Miki Taki
G01 - MEASURING TESTING
Information
Patent Grant
Pattern recognition system
Patent number
5,911,002
Issue date
Jun 8, 1999
Hitachi, Ltd.
Satoshi Mitsuyama
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
PARTICLE IMAGE ANALYSIS APPARATUS
Publication number
20120134559
Publication date
May 31, 2012
Hitachi High-Technologies Corporation
Akiko Suzuki
G01 - MEASURING TESTING
Information
Patent Application
FLOW TYPE PARTICLE IMAGE ANALYSIS METHOD AND DEVICE
Publication number
20120076349
Publication date
Mar 29, 2012
Hitachi High-Technologies Corporation
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE IMAGE ANALYSIS METHOD AND APPARATUS
Publication number
20110090247
Publication date
Apr 21, 2011
Hitachi High-Technologies Corporation
Miki Taki
G01 - MEASURING TESTING