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Norio Oowada
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Katsuta, JP
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last 30 patents
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Patent Grant
Particle image analyzing apparatus
Patent number
6,229,912
Issue date
May 8, 2001
Hitachi, Ltd.
Hatsue Katahira
G01 - MEASURING TESTING
Information
Patent Grant
Flow type particle image analyzing method and apparatus for display...
Patent number
5,878,160
Issue date
Mar 2, 1999
Hitachi, Ltd.
Hideyuki Horiuchi
G01 - MEASURING TESTING
Information
Patent Grant
Device for the classification and examination of particles in fluid
Patent number
5,715,182
Issue date
Feb 3, 1998
Hitachi, Ltd.
Hideki Asai
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for flow type particle image analysis using a...
Patent number
5,561,517
Issue date
Oct 1, 1996
Hitachi, Ltd.
Hideyuki Horiuchi
G01 - MEASURING TESTING