Norio Sakaiya

Follow

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,611,640
- Issue date Dec 17, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,351,683
- Issue date Jan 8, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20130100446
- Publication date Apr 25, 2013
- HITACHI HIGH-TECNOLOGIES CORPORATION
- Hiroyuki YAASHITA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20090161943
- Publication date Jun 25, 2009
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G06 - COMPUTING CALCULATING COUNTING