Norio Sasayama

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis apparatus
- Patent number 7,508,907
- Issue date Mar 24, 2009
- SII NanoTechnology Inc.
- Norio Sasayama
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus
- Patent number 7,471,763
- Issue date Dec 30, 2008
- Sii Nano Technology Inc.
- Norio Sasayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical axis adjusting mechanism for X-ray lens, X-ray analytical i...
- Patent number 7,289,597
- Issue date Oct 30, 2007
- SII NanoTechnology Inc.
- Norio Sasayama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20080056442
- Publication date Mar 6, 2008
- Norio Sasayama
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent x-ray analysis apparatus
- Publication number 20070280414
- Publication date Dec 6, 2007
- Norio Sasayama
- G01 - MEASURING TESTING
Information Patent Application
Optical axis adjusting mechanism for X-ray lens, X-ray analytical i...
- Publication number 20060226340
- Publication date Oct 12, 2006
- Norio Sasayama
- G01 - MEASURING TESTING
Information Patent Application
Superconducting X-ray analyzer
- Publication number 20060104419
- Publication date May 18, 2006
- Norio Sasayama
- G01 - MEASURING TESTING