Norio Satou

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Hitachiota, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern defect analysis equipment, pattern defect analysis method a...
- Patent number 8,280,148
- Issue date Oct 2, 2012
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern defect analysis equipment, pattern defect analysis method a...
- Patent number 8,121,393
- Issue date Feb 21, 2012
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern search method
- Patent number 7,941,008
- Issue date May 10, 2011
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN DEFECT ANALYSIS EQUIPMENT, PATTERN DEFECT ANALYSIS METHOD A...
- Publication number 20120114221
- Publication date May 10, 2012
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DEFECT ANALYSIS EQUIPMENT, PATTERN DEFECT ANALYSIS METHOD A...
- Publication number 20090180680
- Publication date Jul 16, 2009
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern search method
- Publication number 20050232493
- Publication date Oct 20, 2005
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING