Norio Watanabe

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Instrument and method for observing selected stored images acquired...
- Patent number 6,888,137
- Issue date May 3, 2005
- Jeol Ltd.
- Atsushi Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning charged-particle beam instrument
- Patent number 6,444,991
- Issue date Sep 3, 2002
- Jeol Ltd.
- Atsushi Yamada
- H01 - BASIC ELECTRIC ELEMENTS