Noritaka Kamikubo

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method for producing the same
- Patent number 8,426,857
- Issue date Apr 23, 2013
- Sharp Kabushiki Kaisha
- Noritaka Kamikubo
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device, and polishing apparatus
- Patent number 8,222,144
- Issue date Jul 17, 2012
- Sharp Kabushiki Kaisha
- Noritaka Kamikubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of manufacturing semiconductor device
- Patent number 6,794,267
- Issue date Sep 21, 2004
- Sharp Kabushiki Kaisha
- Noritaka Kamikubo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING THE SAME
- Publication number 20110114951
- Publication date May 19, 2011
- Sharp Kabushiki Kaisha
- Noritaka Kamikubo
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing semiconductor device, and polishing apparatus
- Publication number 20100035438
- Publication date Feb 11, 2010
- Sharp Kabushiki Kaisha
- Noritaka Kamikubo
- H01 - BASIC ELECTRIC ELEMENTS