Noritomo Mitsugi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of evaluating silicon layer and a method of manufacturing si...
- Patent number 11,183,433
- Issue date Nov 23, 2021
- Sumco Corporation
- Sayaka Makise
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring carbon concentration of silicon sample, method...
- Patent number 10,935,510
- Issue date Mar 2, 2021
- Sumco Corporation
- Kazutaka Eriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating manufacturing process of silicon material and...
- Patent number 10,676,840
- Issue date Jun 9, 2020
- Sumco Corporation
- Noritomo Mitsugi
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating metal contamination in semiconductor wafer and...
- Patent number 9,842,779
- Issue date Dec 12, 2017
- Sumco Corporation
- Kei Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of removing heavy metal in semiconductor substrate
- Patent number 8,173,523
- Issue date May 8, 2012
- Sumco Corporation
- Noritomo Mitsugi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MEASURING CONTACT ANGLE OF SILICON WAFER AND METHOD OF EV...
- Publication number 20240344951
- Publication date Oct 17, 2024
- SUMCO CORPORATION
- Sayaka MAKISE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EVALUATING SILICON LAYER AND A METHOD OF MANUFACTURING SI...
- Publication number 20200343149
- Publication date Oct 29, 2020
- SUMCO CORPORATION
- Sayaka MAKISE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING CARBON CONCENTRATION OF SILICON SAMPLE, METHOD...
- Publication number 20190064098
- Publication date Feb 28, 2019
- SUMCO CORPORATION
- Kazutaka ERIGUCHI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF EVALUATING MANUFACTURING PROCESS OF SILICON MATERIAL AND...
- Publication number 20180179661
- Publication date Jun 28, 2018
- SUMCO CORPORATION
- Noritomo MITSUGI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF EVALUATING METAL CONTAMINATION IN SEMICONDUCTOR WAFER AND...
- Publication number 20150318222
- Publication date Nov 5, 2015
- SUMCO CORPORATION
- Kei MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF REMOVING HEAVY METAL IN SEMICONDUCTOR SUBSTRATE
- Publication number 20110086494
- Publication date Apr 14, 2011
- SUMCO CORPORATION
- Noritomo Mitsugi
- H01 - BASIC ELECTRIC ELEMENTS