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Noriyasu Hasegawa

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Rotation-angle detection device
    • Patent number 9,234,738
    • Issue date Jan 12, 2016
    • Mitsubishi Electric Corporation
    • Takumi Asano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Encoder
    • Patent number 9,157,770
    • Issue date Oct 13, 2015
    • Mitsubishi Electric Corporation
    • Yoichi Omura
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ENCODER
    • Publication number 20140091213
    • Publication date Apr 3, 2014
    • MITSUBISHI ELECTRIC CORPORATION
    • Yoichi Omura
    • G01 - MEASURING TESTING
  • Information Patent Application

    ROTATION-ANGLE DETECTION DEVICE
    • Publication number 20130200885
    • Publication date Aug 8, 2013
    • MITSUBISHI ELECTRIC CORPORATION
    • Takumi Asano
    • G01 - MEASURING TESTING