Noriyoshi KOZUKA

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Ibaraki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and circuit apparatus
- Patent number 8,516,430
- Issue date Aug 20, 2013
- Advantest Corporation
- Noriyoshi Kozuka
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, test method and manufacturing method
- Patent number 8,014,969
- Issue date Sep 6, 2011
- Advantest Corporation
- Hirokatsu Niijima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device testing apparatus and its calibration method
- Patent number 6,417,682
- Issue date Jul 9, 2002
- Advantest Corporation
- Toshikazu Suzuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS, CALIBRATION METHOD AND RECORDING MEDIUM
- Publication number 20120062256
- Publication date Mar 15, 2012
- Advantest Corporation
- Noriyoshi KOZUKA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND CIRCUIT APPARATUS
- Publication number 20100189003
- Publication date Jul 29, 2010
- Advantest Corporation
- Noriyoshi KOZUKA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD
- Publication number 20090240365
- Publication date Sep 24, 2009
- Advantest Corporation
- HIROKATSU NIIJIMA
- G01 - MEASURING TESTING