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Noriyoshi Yoshida
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Kobe, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sample analyzer and sample analyzing method
Patent number
9,243,993
Issue date
Jan 26, 2016
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer, sample analyzing method, and computer program product
Patent number
8,663,559
Issue date
Mar 4, 2014
Sysmex Corporation
Masaharu Shibata
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and its components
Patent number
7,988,914
Issue date
Aug 2, 2011
SYSMEX CORPORATION
Toshikatsu Fukuju
G01 - MEASURING TESTING
Information
Patent Grant
Liquid aspirator and analyzer provided with same
Patent number
7,981,384
Issue date
Jul 19, 2011
SYSMEX CORPORATION
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and its components
Patent number
7,919,044
Issue date
Apr 5, 2011
Sysmex Corporation
Toshikatsu Fukuju
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and its components
Patent number
7,427,376
Issue date
Sep 23, 2008
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Automatic sample analyzer and its components
Patent number
6,772,650
Issue date
Aug 10, 2004
Sysmex Corporation
Yasuhiro Ohyama
G01 - MEASURING TESTING
Information
Patent Grant
Vessel
Patent number
D482793
Issue date
Nov 25, 2003
Sysmex Corporation
Yasuhiro Oyama
D24 - Medical and laboratory equipment
Information
Patent Grant
Sample analyzer
Patent number
D482796
Issue date
Nov 25, 2003
Sysmex Corporation
Yasuhiro Oyama
D24 - Medical and laboratory equipment
Information
Patent Grant
Inner cap for a vessel
Patent number
D480640
Issue date
Oct 14, 2003
Sysmex Corporation
Yasuhiro Oyama
D09 - Packages and containers for goods
Patents Applications
last 30 patents
Information
Patent Application
Sample analyzer, sample analyzing method, and computer program product
Publication number
20080241957
Publication date
Oct 2, 2008
Sysmex Corporation
Masaharu Shibata
G01 - MEASURING TESTING
Information
Patent Application
Sample Analyzer and Its Components
Publication number
20080219886
Publication date
Sep 11, 2008
Toshikatsu Fukuju
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SAMPLE ANALYZER AND ITS COMPONENTS
Publication number
20080063568
Publication date
Mar 13, 2008
Toshikatsu Fukuju
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Sample analyzer and sample analyzing method
Publication number
20060210438
Publication date
Sep 21, 2006
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Application
Liquid aspirator and analyzer provided with same
Publication number
20050013744
Publication date
Jan 20, 2005
Sysmex Corporation
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Sample analyzer and its components
Publication number
20040105784
Publication date
Jun 3, 2004
Toshikatsu Fukuju
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Automatic sample analyzer and its components
Publication number
20030070498
Publication date
Apr 17, 2003
Yasuhiro Ohyama
G01 - MEASURING TESTING