Noriyuki Kaneoka

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ion source, ion beam processing/observation apparatus, charged part...
- Patent number 8,779,400
- Issue date Jul 15, 2014
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion source, ion beam processing/observation apparatus, charged part...
- Patent number 8,481,980
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dual beam apparatus with tilting sample stage
- Patent number 8,431,891
- Issue date Apr 30, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge particle beam system, sample processing method, and semicond...
- Patent number 7,777,183
- Issue date Aug 17, 2010
- Hitachi High-Technologies Corporation
- Noriyuki Kaneoka
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam processing apparatus
- Patent number 7,700,931
- Issue date Apr 20, 2010
- Hitachi High-Tchnologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for ion beam fabrication
- Patent number 7,696,496
- Issue date Apr 13, 2010
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing equipment using ION beam or electron beam
- Patent number 7,592,606
- Issue date Sep 22, 2009
- Hitachi High-Technologies Corporation
- Koji Ishiguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 5,659,174
- Issue date Aug 19, 1997
- Hitachi, Ltd.
- Noriyuki Kaneoka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION BEAM PROCESSING APPARATUS
- Publication number 20130320209
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...
- Publication number 20130284593
- Publication date Oct 31, 2013
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ION BEAM PROCESSING APPARATUS
- Publication number 20100176297
- Publication date Jul 15, 2010
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...
- Publication number 20090230299
- Publication date Sep 17, 2009
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Apparatus for ion beam fabrication
- Publication number 20080283778
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM PROCESSING APPARATUS
- Publication number 20080073582
- Publication date Mar 27, 2008
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System, Sample Processing Method, and Semicon...
- Publication number 20080029699
- Publication date Feb 7, 2008
- Hitachi High-Technologies Corporation
- Noriyuki KANEOKA
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing Equipment Using ION Beam or Electron Beam
- Publication number 20080018460
- Publication date Jan 24, 2008
- Hitachi High-Technologies Corporation
- Koji Ishiguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam system, semiconductor inspection system, and...
- Publication number 20070158560
- Publication date Jul 12, 2007
- Hitachi High-Technologies Corporation
- Noriyuki Kaneoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion beam apparatus and analysis method
- Publication number 20060284115
- Publication date Dec 21, 2006
- Noriyuki Kaneoka
- H01 - BASIC ELECTRIC ELEMENTS

Noriyuki Kaneoka

Person

Patents Grantslast 30 patents

Ion source, ion beam processing/observation apparatus, charged part...

Ion source, ion beam processing/observation apparatus, charged part...

Dual beam apparatus with tilting sample stage

Charge particle beam system, sample processing method, and semicond...

Ion beam processing apparatus

Apparatus for ion beam fabrication

Manufacturing equipment using ION beam or electron beam

Scanning electron microscope

Patents Applicationslast 30 patents

ION BEAM PROCESSING APPARATUS

ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...

ION BEAM PROCESSING APPARATUS

ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...

Apparatus for ion beam fabrication

ION BEAM PROCESSING APPARATUS

Charged Particle Beam System, Sample Processing Method, and Semicon...

Manufacturing Equipment Using ION Beam or Electron Beam

Charged particle beam system, semiconductor inspection system, and...

Ion beam apparatus and analysis method